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Physics > Atomic Physics

arXiv:physics/0407094 (physics)
[Submitted on 17 Jul 2004 (v1), last revised 25 Mar 2005 (this version, v4)]

Title:Atom chips in the real world: the effects of wire corrugation

Authors:Thorsten Schumm (LCFIO), Jèrôme Estève (LCFIO), Christine Aussibal (LCFIO), Cristina Figl (LCFIO), Jean-Baptiste Trebbia (LCFIO), Hai Nguyen (LCFIO), Dominique Mailly (LPN), Isabelle Bouchoule (LCFIO), Christopher Westbrook (LCFIO), Alain Aspect (LCFIO)
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Abstract: We present a detailed model describing the effects of wire corrugation on the trapping potential experienced by a cloud of atoms above a current carrying micro wire. We calculate the distortion of the current distribution due to corrugation and then derive the corresponding roughness in the magnetic field above the wire. Scaling laws are derived for the roughness as a function of height above a ribbon shaped wire. We also present experimental data on micro wire traps using cold atoms which complement some previously published measurements and which demonstrate that wire corrugation can satisfactorily explain our observations of atom cloud fragmentation above electroplated gold wires. Finally, we present measurements of the corrugation of new wires fabricated by electron beam lithography and evaporation of gold. These wires appear to be substantially smoother than electroplated wires.
Subjects: Atomic Physics (physics.atom-ph)
Cite as: arXiv:physics/0407094 [physics.atom-ph]
  (or arXiv:physics/0407094v4 [physics.atom-ph] for this version)
  https://doi.org/10.48550/arXiv.physics/0407094
Journal reference: European Physical Journal D 32 (2005) 171-180
Related DOI: https://doi.org/10.1140/epjd/e2005-00016-x

Submission history

From: M. Thorsten Schumm [view email] [via CCSD proxy]
[v1] Sat, 17 Jul 2004 07:37:02 UTC (189 KB)
[v2] Thu, 22 Jul 2004 15:06:11 UTC (174 KB)
[v3] Sat, 19 Feb 2005 13:55:30 UTC (179 KB)
[v4] Fri, 25 Mar 2005 14:57:31 UTC (179 KB)
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