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Condensed Matter > Materials Science

arXiv:cond-mat/9811158 (cond-mat)
[Submitted on 11 Nov 1998]

Title:Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

Authors:Steven M. Anlage, D. E. Steinhauer, C. P. Vlahacos, B. J. Feenstra, A. S. Thanawalla, Wensheng Hu, Sudeep K. Dutta, F. C. Wellstood (University of Maryland)
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Abstract: We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
Comments: 6 pages with 9 figures, Proceedings of the Applied Superconductivity Conference 1998
Subjects: Materials Science (cond-mat.mtrl-sci); Superconductivity (cond-mat.supr-con)
Cite as: arXiv:cond-mat/9811158 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/9811158v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.cond-mat/9811158
Journal reference: IEEE Trans. Appl. Supercond. 9, 4127 (1999)
Related DOI: https://doi.org/10.1109/77.783934

Submission history

From: Johan Feenstra [view email]
[v1] Wed, 11 Nov 1998 15:59:53 UTC (329 KB)
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