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Condensed Matter > Materials Science

arXiv:2504.00507 (cond-mat)
[Submitted on 1 Apr 2025]

Title:A dual-scale stochastic analysis framework for creep failure considering microstructural randomness

Authors:Weichen Kong, Yanwei Dai, Xiang Zhang, Yinghua Liu
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Abstract:Creep failure under high temperatures is a complex multiscale and multi-mechanism issue involving inherent microstructural randomness. To investigate the effect of microstructures on the uniaxial/multiaxial creep failure, a dual-scale stochastic analysis framework is established to introduce the grain boundary (GB) characteristics into the macroscopic analysis. The nickel-base superalloy Inconel 617 is considered in this study. Firstly, the damage mechanisms of GBs are investigated based on the crystal plasticity finite element (CPFE) method and cohesive zone model (CZM). Subsequently, based on the obtained GB damage evolution, a novel Monte Carlo (MC) approach is proposed to establish the relationship between the GB orientation and area distribution and macroscopic creep damage. Finally, a dual-scale stochastic multiaxial creep damage model is established to incorporate the influence of the random GB orientation and area distribution. With the numerical application of the proposed creep damage model, the random initiation and growth of creep cracks in the uniaxial tensile specimen and the pressurized tube are captured and analyzed. The proposed stochastic framework effectively considers the inherent randomness introduced by GB characteristics and efficiently realizes full-field multiscale calculations. It also shows its potential applications in safety evaluation and life prediction of creep components and structures under high temperatures.
Subjects: Materials Science (cond-mat.mtrl-sci); Classical Physics (physics.class-ph)
Cite as: arXiv:2504.00507 [cond-mat.mtrl-sci]
  (or arXiv:2504.00507v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.2504.00507

Submission history

From: Weichen Kong [view email]
[v1] Tue, 1 Apr 2025 07:57:22 UTC (11,023 KB)
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