Title:Analysis of Josephson Junction Barrier Variation -- a Combined STEM, Breakdown and Monte-Carlo Approach

Abstract:Josephson junctions manufactured to tight tolerances are necessary components for superconducting quantum computing. Developing precise manufacturing techniques for Josephson junctions requires an understanding of their make-up and robust feedback metrics against which to optimise. Here we consider complementary techniques assessing what conclusions they allow us to draw about the barriers in junctions. Monte-Carlo simulations of barriers show that standard deviations of 15-20 % of the total barrier thickness are compatible with our experimental data. Electrical breakdown allows us to probe the weakest points in barriers. Narrowing the distribution of this breakdown provides a promising feedback mechanism for barrier optimisation. Grouping junctions by breakdown voltage allows us to identify sub-ensembles of junctions with different median resistance, highlighting the importance of weak spots in junction parameters such as resistance. Transmission electron microscopy can be used to find average barrier thickness, although we highlight challenges forming robust conclusions on the distribution of thicknesses in a barrier from these experiments.