Title:Bayesian multi-parameter quantum metrology with limited data

Abstract:A longstanding problem in quantum metrology is how to extract as much information as possible in realistic scenarios, which typically involve multiple parameters, limited measurement data and some degree of prior information. Here we present a practical strategy for achieving just this. First we derive a new Bayesian multi-parameter quantum bound. We then show how to construct the optimal measurement when our bound can be saturated for a single shot and consider experiments involving a repeated sequence of these measurements. Our method properly accounts for the number of measurements and the degree of prior information, and we illustrate our ideas with a qubit sensing network and a model for phase imaging. This approach provides a powerful and useful technique for implementing quantum metrology in a wide-range of practical scenarios as well as gaining new insights about the role of local and global strategies.