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Physics > Instrumentation and Detectors

arXiv:1608.07594 (physics)
[Submitted on 25 Aug 2016]

Title:Lateral IBIC characterization of single crystal synthetic diamond detectors

Authors:A. Lo Giudice, P. Olivero, C. Manfredotti, M. Marinelli, E. Milani, F. Picollo, G. Prestopino, A. Re, V. Rigato, C. Verona, G. Verona-Rinati, E. Vittone
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Abstract:In order to evaluate the charge collection efficiency (CCE) profile of single-crystal diamond devices based on a p type/intrinsic/metal configuration, a lateral Ion Beam Induced Charge (IBIC) analysis was performed over their cleaved cross sections using a 2 MeV proton microbeam. CCE profiles in the depth direction were extracted from the cross-sectional maps at variable bias voltage. IBIC spectra relevant to the depletion region extending beneath the frontal Schottky electrode show a 100% CCE, with a spectral resolution of about 1.5%. The dependence of the width of the high efficiency region from applied bias voltage allows the constant residual doping concentration of the active region to be evaluated. The region where the electric field is absent shows an exponentially decreasing CCE profile, from which it is possible to estimate the diffusion length of the minority carriers by means of a drift-diffusion model.
Comments: 17 pages, 6 figures
Subjects: Instrumentation and Detectors (physics.ins-det)
Cite as: arXiv:1608.07594 [physics.ins-det]
  (or arXiv:1608.07594v1 [physics.ins-det] for this version)
  https://doi.org/10.48550/arXiv.1608.07594
Journal reference: Physica Status Solidi - Rapid Research Letters 5 (2), 80-82 (2011)
Related DOI: https://doi.org/10.1002/pssr.201004488

Submission history

From: Paolo Olivero [view email]
[v1] Thu, 25 Aug 2016 14:46:16 UTC (408 KB)
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