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Condensed Matter > Materials Science

arXiv:1403.1357 (cond-mat)
[Submitted on 6 Mar 2014]

Title:Normalized Contact Force to Minimize "Electrode-Lead" Resistance in a Nanodevice

Authors:Seung-Hoon Lee, Jun Bae, Seung Woo Lee, Jae-Won Jang
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Abstract:In this report, the contact resistance between "electrode" and "lead" is investigated for reasonable measurements of samples' resistance in a polypyrrole (PPy) nanowire device. The sample's resistance, including "electrode-lead" contact resistance, shows a decrease as force applied to the interface increases. Moreover, the sample's resistance becomes reasonably similar to, or lower than, values calculated by resistivity of PPy reported in previous studies. The decrease of electrode-lead contact resistance by increasing the applying force was analyzed by using Holm theory: the general equation of relation between contact resistance ($R_H$) of two-metal thin films and contact force ($R_H$ $\propto$ $1/\sqrt{F}$). The present investigation can guide a reliable way to minimize electrode-lead contact resistance for reasonable characterization of nanomaterials in a microelectrode device.
Subjects: Materials Science (cond-mat.mtrl-sci); Other Condensed Matter (cond-mat.other)
Cite as: arXiv:1403.1357 [cond-mat.mtrl-sci]
  (or arXiv:1403.1357v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1403.1357

Submission history

From: Jae-Won Jang [view email]
[v1] Thu, 6 Mar 2014 06:28:18 UTC (377 KB)
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