Title:Quantitative Measure of Hysteresis for Bernoulli Memristors

Abstract:The memristor since its conceptual postulation in 1971 by Leon Chua has remained an elusive, theoretical electronic element. However, the recent fabrication of a device whose behaviour was successfully explained in the context of memristors has reignited the interest of many research groups who try to identify memristive behaviour in existing devices or fabricate new ones. The analysis of the models suggested to approximate the behaviour of these devices involves the use of numerical temporal integration, when trying to simulate how the model will respond to a given stimulus with time. This paper introduces a mathematical framework for a certain class of memristors, the Bernoulli memristors, whose dynamics comply with Bernoulli's differential equation. Such differentials can always be linearised and thus make it easier to obtain analytic/closed form expressions of the form v(t) = f (i(t)) or i(t) = g(v(t)) which relate the current i(t) through the memristor with the voltage v(t) across it. We then proceed by defining a way of quantifying the hysteresis of the i - v characteristic curve as a means of measuring the non-linearity of the memristor. The two new concepts introduced, are demonstrated for three fundamental waveforms using a simple circuit model which falls into the class of Bernoulli memristors, focusing more on the charge controlled case. The analysis reveals the dependence of the hysteresis measure on a single parameter which governs its behaviour. Finally, we show how this observation may help when selecting the model's parameters in order to obtain pre-specified i - v from the device.