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Electrical Engineering and Systems Science > Systems and Control

arXiv:2501.16923 (eess)
[Submitted on 28 Jan 2025]

Title:In-Circuit Characterization of Low-Frequency Stability Margins in Power Amplifiers

Authors:Jose Manuel Gonzalez, Nerea Otegi, Aitziber Anakabe, Libe Mori, Asier Barcenilla, Juan-Mari Collantes
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Abstract:Low-frequency resonances with low stability margins affect video bandwidth characteristics of power amplifiers. In this work, a non-connectorized measurement technique is presented to obtain the low-frequency critical poles at internal nodes of a hybrid amplifier. The experimental setup uses a high impedance probe connected to a vector network analyzer (VNA) to obtain a fully calibrated closed-loop frequency response that is identified to get the poles of the device at low frequency. Compared to previous connectorized solutions, the approach avoids the ad-hoc insertion of extra RF connectors to access the low-frequency dynamics of the amplifier. In addition, it simplifies the characterization at multiple internal nodes, which is worthwhile for an efficient detection and fixing of critical low frequency dynamics in multistage power amplifiers. The technique is first applied to dc steady state regimes and compared to the connectorized approach on a single stage amplifier. Next, it is applied to a three-stage amplifier to show its potential to detect the origin of the undesired dynamics and the most effective way to increase stability margin. Finally, the technique has been extended to the large-signal case to increase its usefulness for the design and diagnosis of high power amplifiers.
Comments: 13 pages, 24 figures
Subjects: Systems and Control (eess.SY)
Cite as: arXiv:2501.16923 [eess.SY]
  (or arXiv:2501.16923v1 [eess.SY] for this version)
  https://doi.org/10.48550/arXiv.2501.16923
Journal reference: IEEE Transactions on Microwave Theory and Techniques 67(2) : 822-833 (2019)
Related DOI: https://doi.org/10.1109/TMTT.2018.2883568

Submission history

From: Aitziber Anakabe [view email]
[v1] Tue, 28 Jan 2025 13:10:38 UTC (1,613 KB)
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