Title:Stochastic Resonance Spectroscopy: Characterizing Fast Dynamics with Slow Measurements

Abstract:A system's internal dynamics and its interaction with the environment can be determined by tracking how external perturbations affect its transition rates between states. However, accurately measuring these rates poses a significant challenge, especially when they span a wide range of time scales. Here we introduce a broadband measurement method, called stochastic resonance spectroscopy (SRS), that operates in the frequency domain and quantifies the stochastic dynamics of atomic-scale quantum systems. We apply this method to determine spin switching rates in a scanning tunneling microscope over an extremely wide frequency range, from 199 ms^-1 for few-atom structures to 1.73 ns^-1 for individual atoms. SRS relies on the universal phenomenon of stochastic resonance which synchronizes stochastic dynamics to an oscillating perturbation. We develop an analytical theory that extracts quantitative transition rates from scanning tunneling microscopy measurements of the frequency-dependent tunnel current and show that the signal is dominated by homodyne detection. Our theory indicates that SRS is not limited to spin dynamics and we corroborate this by measuring transport dynamics through a bound state in a superconductor. We anticipate that the ability to characterize broadband stochastic dynamics at the atomic scale will enable insights into excited-state dynamics of quantum systems and even non-Markovian processes emerging from correlations with the environment.