Title:Achieving a combined 15 microns and 60 ps test beam resolution using an RSD 450 microns pitch pixel matrix connected to a FAST2 ASIC

Abstract:This paper reports on the spatial and temporal resolutions of an RSD 450 microns pitch pixels array measured at the DESY test beam facility. RSDs, Resistive Silicon Detectors, also known as AC-LGAD, achieve excellent position and temporal resolution by exploiting charge sharing among neighboring electrodes. The RSD matrix used in this study is part of the second FBK RSD production, RSD2, composed of 450-micron pitch pixels with cross-shaped electrodes. A 7-pixel matrix was read out by the FAST2 ASIC, a 16-channel amplifier fully custom ASIC developed by INFN Torino using the 110 nm CMOS technology. The total area covered by the matrix is about 1.5 mm2. The position resolution reached in this test is 15 microns, about 3.4% of the pitch. The temporal resolution achieved in this work is 60 ps, dominated by the FAST2 resolution. The work also demonstrates that RSD sensors achieve 100% fill factor and homogenous resolutions over the whole matrix surface, making them suitable for 4D tracking applications.