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Electrical Engineering and Systems Science > Signal Processing

arXiv:2202.13048 (eess)
[Submitted on 26 Feb 2022]

Title:Bayesian Ridge Regression Based Model to Predict Fault Location in HVdc Network

Authors:Timothy Flavin, Thomas Steiner, Bhaskar Mitra, Vidhyashree nagaraju
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Abstract:This paper discusses a method for accurately estimating the fault location in multi-terminal High Voltage direct current (HVdc) transmission network using single ended current and voltage measurements. The post-fault voltage and current signatures are a function of multiple factors and thus accurately locating faults on a multi-terminal network is challenging. We discuss a novel data-driven Bayes Regression based method for accurately predicting fault locations. The sensitivity of the proposed algorithm to measurement noise, fault location, resistance and current limiting inductance are performed on a radial three-terminal MTdc network. The test system is designed in Power System Computer Aided Design (PSCAD)/Electromagnetic Transients including dc (EMTdc).
Comments: arXiv admin note: text overlap with arXiv:2201.08263
Subjects: Signal Processing (eess.SP)
Cite as: arXiv:2202.13048 [eess.SP]
  (or arXiv:2202.13048v1 [eess.SP] for this version)
  https://doi.org/10.48550/arXiv.2202.13048

Submission history

From: Bhaskar Mitra [view email]
[v1] Sat, 26 Feb 2022 03:29:29 UTC (913 KB)
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