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Physics > Instrumentation and Detectors

arXiv:2008.12739 (physics)
[Submitted on 28 Aug 2020]

Title:High-Bandwidth, Variable-Resistance Differential Noise Thermometry

Authors:Artem Vladimirovich Talanov (1), Jonah Waissman (1), Takashi Taniguchi (2), Kenji Watanabe (2), Philip Kim (1), ((1) Harvard University, USA (2) National Institute for Materials Science, Japan)
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Abstract:We develop Johnson noise thermometry applicable to mesoscopic devices with variable source impedance with high bandwidth for fast data acquisition. By implementing differential noise measurement and two-stage impedance matching, we demonstrate noise measurement in the frequency range 120-250 MHz with a wide sample resistance range 30 {\Omega}-100 k{\Omega} tuned by gate voltages and temperature. We employ high-frequency, single-ended low noise amplifiers maintained at a constant cryogenic temperature in order to maintain the desired low noise temperature. We achieve thermometer calibration with temperature precision up to 650 mK on a 10 K background with 30 s of averaging. Using this differential noise thermometry technique, we measure thermal conductivity on a bilayer graphene sample spanning the metallic and semiconducting regimes in a wide resistance range, and we compare it to the electrical conductivity.
Comments: 9 pages, 4 figures; submitted to Review of Scientific Instruments
Subjects: Instrumentation and Detectors (physics.ins-det); Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Cite as: arXiv:2008.12739 [physics.ins-det]
  (or arXiv:2008.12739v1 [physics.ins-det] for this version)
  https://doi.org/10.48550/arXiv.2008.12739
Journal reference: Rev.Sci.Instrum. 92, 014904 (2021)
Related DOI: https://doi.org/10.1063/5.0026488

Submission history

From: Artem Talanov [view email]
[v1] Fri, 28 Aug 2020 16:53:49 UTC (17,457 KB)
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