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Condensed Matter > Mesoscale and Nanoscale Physics

arXiv:1501.00170 (cond-mat)
[Submitted on 31 Dec 2014]

Title:Temperature dependent transport characteristics of graphene/n-Si diodes

Authors:S. Parui, R. Ruiter, P. J. Zomer, M. Wojtaszek, B. J. van Wees, T. Banerjee
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Abstract:Realizing an optimal Schottky interface of graphene on Si is challenging, as the electrical transport strongly depends on the graphene quality and the fabrication processes. Such interfaces are of increasing research interest for integration in diverse electronic devices as they are thermally and chemically stable in all environments, unlike standard metal/semiconductor interfaces. We fabricate such interfaces with n-type Si at ambient conditions and find their electrical characteristics to be highly rectifying, with minimal reverse leakage current ($<$10$^{-10}$ A) and rectification of more than $10^6$. We extract Schottky barrier height of 0.69 eV for the exfoliated graphene and 0.83 eV for the CVD graphene devices at room temperature. The temperature dependent electrical characteristics suggest the influence of inhomogeneities at the graphene/n-Si interface. A quantitative analysis of the inhomogeneity in Schottky barrier heights is presented using the potential fluctuation model proposed by Werner and Güttler.
Comments: 5 pages, 5 figures
Subjects: Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Cite as: arXiv:1501.00170 [cond-mat.mes-hall]
  (or arXiv:1501.00170v1 [cond-mat.mes-hall] for this version)
  https://doi.org/10.48550/arXiv.1501.00170
Journal reference: Journal of Applied Physics 116, 244505 (2014)
Related DOI: https://doi.org/10.1063/1.4905110

Submission history

From: Subir Parui [view email]
[v1] Wed, 31 Dec 2014 16:41:53 UTC (4,231 KB)
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