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Condensed Matter > Soft Condensed Matter

arXiv:1302.6630 (cond-mat)
[Submitted on 27 Feb 2013 (v1), last revised 6 Mar 2013 (this version, v2)]

Title:More Reliable Measurements of the Slip Length with the Atomic Force Microscope

Authors:Phil Attard
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Abstract:Further improvements are made to the non-linear data analysis algorithm for the atomic force microscope [P. Attard, arXiv:1212.3019v2 (2012)]. The algorithm is required when there is curvature in the compliance region due to photo-diode non-linearity. Results are obtained for the hydrodynamic drainage force, for three surfaces: hydrophilic silica (symmetric, Si-Si), hydrophobic dichlorodimethylsilane (symmetric, DCDMS-DCDMS), and hydrophobic octadecyltrichlorosilane (asymmetric, Si-OTS). The drainage force was measured in the viscous liquid di-n-octylphthalate. The slip-lengths are found to be 3nm for Si, 2nm for DCDMS, and 2nm for OTS, with an uncertainty on the order of a nanometer. These slip lengths are a factor of 4--15 times smaller than those obtained from previous analysis of the same raw data [L. Zhu et al., Langmuir, 27, 6712 (2011). Ibid, 28, 7768 (2012)].
Comments: 18 pages, 11 figures (improved discussion of cantilever drag)
Subjects: Soft Condensed Matter (cond-mat.soft); Chemical Physics (physics.chem-ph); Fluid Dynamics (physics.flu-dyn); Instrumentation and Detectors (physics.ins-det)
Cite as: arXiv:1302.6630 [cond-mat.soft]
  (or arXiv:1302.6630v2 [cond-mat.soft] for this version)
  https://doi.org/10.48550/arXiv.1302.6630

Submission history

From: Phil Attard [view email]
[v1] Wed, 27 Feb 2013 00:10:35 UTC (2,282 KB)
[v2] Wed, 6 Mar 2013 00:59:39 UTC (2,312 KB)
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