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Physics > Optics

arXiv:1212.3242 (physics)
[Submitted on 11 Dec 2012]

Title:Polarization Invariants and Retrieval of Surface Parameters Using Polarization Measurements in Remote Sensing Applications

Authors:Yu. K. Shestopaloff
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Abstract:Using polarization measurements in remote sensing and optical studies allows retrieving more information. We consider relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain polarization properties of reflected waves and polarization invariants, in particular at incident angle of forty five degrees, allow finding amplitude and phase characteristics of reflected waves. Based on this study, we introduce methods for finding dielectric permittivity, temperature and geometrical characteristics of observed surfaces. Experimental results prove that these methods can be used for different practical purposes in technological and remote sensing applications, in a broad range of electromagnetic spectrum.
Comments: 37 pages, 7 figures, 1 table
Subjects: Optics (physics.optics)
Cite as: arXiv:1212.3242 [physics.optics]
  (or arXiv:1212.3242v1 [physics.optics] for this version)
  https://doi.org/10.48550/arXiv.1212.3242
Journal reference: Applied Optics, 2011, V. 50, Iss. 36, p. 6606-6616
Related DOI: https://doi.org/10.1364/AO.50.006606

Submission history

From: Yuri Shestopaloff [view email]
[v1] Tue, 11 Dec 2012 21:36:31 UTC (123 KB)
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