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Condensed Matter > Mesoscale and Nanoscale Physics

arXiv:0812.0690 (cond-mat)
[Submitted on 3 Dec 2008]

Title:Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

Authors:P. Nemes-Incze, Z. Osvath, K. Kamaras, L.P. Biro
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Abstract: Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thickness of individual FLG films. However, reports from literature show a large variation of the measured thickness of graphene layers. This paper is focused on the imaging mechanism of tapping mode AFM (TAFM) when measuring graphene and FLG thickness and we show that at certain measurement parameters significant deviations can be introduced in the measured thickness of FLG flakes. An increase of as much as 1 nm can be observed in the measured height of FLG crystallites, when using an improperly chosen range of free amplitude values of the tapping cantilever. We present comparative Raman spectroscopy and TAFM measurements on selected single and multilayer graphene films, based on which we suggest ways to correctly measure graphene and FLG thickness using TAFM.
Subjects: Mesoscale and Nanoscale Physics (cond-mat.mes-hall); Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:0812.0690 [cond-mat.mes-hall]
  (or arXiv:0812.0690v1 [cond-mat.mes-hall] for this version)
  https://doi.org/10.48550/arXiv.0812.0690
Journal reference: CARBON, Volume: 46, Issue: 11, Pages: 1435-1442, Published: SEP 2008
Related DOI: https://doi.org/10.1016/j.carbon.2008.06.022

Submission history

From: Peter Nemes - Incze [view email]
[v1] Wed, 3 Dec 2008 10:53:53 UTC (2,222 KB)
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